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  4. Analysis of white light interferograms using wavelet methods
 
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1998
Journal Article
Title

Analysis of white light interferograms using wavelet methods

Abstract
Several methods for the analysis of white light interferograms are presented and their performance is compared to a new method employing the wavelet transform in connection with sub-Nyquist sampling. As the result of computer simulations and experiments the wavelet method proves to be best suited to the problem.
Author(s)
Recknagel, R.-J.
Notni, G.
Journal
Optics communications  
DOI
10.1016/S0030-4018(97)00644-5
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • surface profile measurement

  • wavelet transformation

  • white light interferometry

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