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  4. Performance of tri-gate AlGaN/GaN HEMTs
 
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2016
Conference Paper
Title

Performance of tri-gate AlGaN/GaN HEMTs

Abstract
The performance of the GaN-based tri-gate HEMT is investigated by 3D numerical simulations. The tri-gate concept is shown to provide normally-off operation and to effectively suppress short-channel effects (SCEs). Furthermore, it is shown from our simulations that tri-gate AlGaN/GaN HEMTs can exhibit higher breakdown voltages and operate closer to the theoretical limit for GaN devices than their planar counterpart. Moreover, the RF performance of tri-gate HEMTs with optimized body design can be superior to that of conventional planar devices.
Author(s)
Alsharef, M.
Granzner, R.
Schwierz, F.
Ture, Erdin  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Quay, Rüdiger  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Ambacher, Oliver  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mainwork
46th European Solid State Device Research Confernce, ESSDERC 2016  
Conference
European Solid-State Device Research Conference (ESSDERC) 2016  
DOI
10.1109/ESSDERC.2016.7599615
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • component

  • gallium nitride

  • HEMT

  • tri-gate

  • device simulation

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