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  4. Local solar cell efficiency analysis performed by injection-dependent PL imaging (ELBA) and voltage-dependent lock-in thermography (Local I-V)
 
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2016
Journal Article
Titel

Local solar cell efficiency analysis performed by injection-dependent PL imaging (ELBA) and voltage-dependent lock-in thermography (Local I-V)

Abstract
In this contribution two methods for performing local efficiency analysis of solar cells are compared with each other by applying them to a solar cell and a neighboring wafer. The first method called "ELBA" is based on injection-dependent photoluminescence (PL) imaging of a passivated wafer. The second method called "Local I-V" is based on voltage-dependent dark lock-in thermography (DLIT) on a solar cell. The results of both methods with respect to the influence of the bulk on the local solar cell parameters are comparable with each other. However, since only "Local I-V" is investigating a finished solar cell, it may image also local ohmic shunts, inhomogeneous front- and backside and depletion region recombination, and Rs effects, whereas "ELBA" is suited for assessing bulk-related efficiency losses in detail, which are not concealed by the aforementioned cell-related loss mechanisms in this method.
Author(s)
Breitenstein, O.
Frühauf, F.
Bauer, J.
Schindler, F.
Michl, B.
Zeitschrift
Energy Procedia
Konferenz
International Conference on Crystalline Silicon Photovoltaics (SiliconPV) 2016
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DOI
10.1016/j.egypro.2016.07.003
Externer Link
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Language
English
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Fraunhofer-Institut für Solare Energiesysteme ISE
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