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  4. Local solar cell efficiency analysis performed by injection-dependent PL imaging (ELBA) and voltage-dependent lock-in thermography (Local I-V)
 
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2016
Journal Article
Title

Local solar cell efficiency analysis performed by injection-dependent PL imaging (ELBA) and voltage-dependent lock-in thermography (Local I-V)

Abstract
In this contribution two methods for performing local efficiency analysis of solar cells are compared with each other by applying them to a solar cell and a neighboring wafer. The first method called "ELBA" is based on injection-dependent photoluminescence (PL) imaging of a passivated wafer. The second method called "Local I-V" is based on voltage-dependent dark lock-in thermography (DLIT) on a solar cell. The results of both methods with respect to the influence of the bulk on the local solar cell parameters are comparable with each other. However, since only "Local I-V" is investigating a finished solar cell, it may image also local ohmic shunts, inhomogeneous front- and backside and depletion region recombination, and Rs effects, whereas "ELBA" is suited for assessing bulk-related efficiency losses in detail, which are not concealed by the aforementioned cell-related loss mechanisms in this method.
Author(s)
Breitenstein, Otwin
Frühauf, Felix
Bauer, J.
Schindler, Florian  
Michl, Bernhard
Journal
Energy Procedia  
Conference
International Conference on Crystalline Silicon Photovoltaics (SiliconPV) 2016  
Open Access
Link
Link
DOI
10.1016/j.egypro.2016.07.003
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English
Fraunhofer-Institut für Solare Energiesysteme ISE  
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