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  4. Scanning tunneling microscopy of lead selenide monocrystals and epitaxial layers on barium fluoride.
 
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1991
Journal Article
Titel

Scanning tunneling microscopy of lead selenide monocrystals and epitaxial layers on barium fluoride.

Alternative
Rastertunnelmikroskopie von Bleiselenid, Einkristalle und epitaktische Schichten auf Bariumfluorid
Abstract
The topography and atomic arrangement on the (100) surface of n- and p-PbSe monocrystals have been studied in air by scanning tunneling microscopy (STM). It was shown that the chemically polished surface is more rough than the freshly cleaved one. The regular patterns of the atomic scale STM images correspond well to the crystallographic positions of atoms on (100) plane. Several types of surface defects were observed. The peculiarities of the registrations of atomic scale STM images of PbSe monocrystals are discussed. STM was also applied to structure analysis of molecular beam epitaxial layers of PbSe on BaF2 substrate. The topography of epitaxial layers and their atomic structure have been visualized. It appeared that with certain substrate temperatures (100) and (111) oriented grains of PbSe are formed.
Author(s)
Magonov, S.N.
Cantow, H.-J.
Böttner, H.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Meihofer, M.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Schelb, S.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Stocker, W.
Tacke, M.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Zeitschrift
Fresenius' Zeitschrift für Analytische Chemie
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English
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Fraunhofer-Institut für Physikalische Messtechnik IPM
Tags
  • Bleiselenid

  • Halbleiteroberfläche

  • Lead Selenide

  • MBE

  • Rastertunnelmikroskopie

  • scanning tunneling

  • semiconductor surface

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