Verfahren und Vorrichtung zur Hochgeschwindigkeits-Temperierung einer Probe

The invention relates to the temperature control, in particular to the ice crystal-free freezing or thawing of a sample (1), comprising the steps of providing the sample (1) on a front side (11) of a carrier substrate (10) and supplying a temperature-control medium (2) to a back side (12) of the carrier substrate (10), wherein the temperature-control medium (2) in the above-critical state and having a pressure that is higher than the atmospheric pressure is brought into contact with the back side (12) of the carrier substrate (10) and the temperature of the sample (1) is rapidly modified. The invention further relates to a temperature control device (100) for the temperature control of a sample.