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Patent
Title

Streulichtmessanordnung zur Untersuchung der Oberflaechenrauheit

Other Title
Scattered light measuring setup to analyze surface roughness
Abstract
Scattered light measuring setup to analyze surface roughness based on the principle of angular-resolution scattered light measurement by means of one or several receiver arrays, characterized by the fact that the individual receivers of the arrays are arranged on curved supports in such a way that the geometric expansion of the individual receivers corresponds in each case to an equidistant interval within the local frequency range.
Inventor(s)
Weigel, T.
Neubert, J.
Hertzsch, A.
Harnisch, B.
Weiss, M.
Schulz, U.
Link to:
Espacenet
Patent Number
1991-4105509
Publication Date
1995
Language
German
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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