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Patent
Title

IPG-Transistor mit vertikalem Gate-Komplex

Other Title
In-plane-gate transistor production by CMOS compatible process - by photolithographically structuring semiconductor layer to separate transistor gate, source, and drain electrodes by a trench, filling and covering trench and electrodes with field oxide and forming contact structures.
Abstract
A process for producing an in-plane-gate (IPG) transistor (10) involves: (a) producing a semiconductor substrate (12) having a semiconductor layer (16) insulated from the substrate by an insulation layer (14); (b) photolithographically structuring the semiconductor layer (16) to separate the transistor gate, source and drain electrodes by a trench (18) which extends down to the insulation layer (14); (c) filling the trench (18) and covering the electrodes and the trench (18) with a field oxide; and (d) producing contact structures (28, 30) for the electrodes. Also claimed is a similar process in which steps (b) and (c) are replaced by photolithographically structuring the semiconductor layer to define source and drain electrodes, photolithographically defining and etching away a subsequent gate region, depositing a gate insulation layer in the etched gate region and depositing the gate electrode on the gate insulation layer. Further claimed are IPG transistors produced as described abo ve. ADVANTAGE - The processes allow IPG transistor production by a simple CMOS compatible method and the transistor is inexpensive, reliable and temperature resistant.
Inventor(s)
Grassl, T.
Link to:
Espacenet
Patent Number
1997-19702531
Publication Date
1998
Language
German
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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