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Patent
Title

Vorrichtung zum ortsaufgeloesten, zerstoerungsfreien Untersuchen von magnetischen Kenngroessen

Other Title
Device for the high-sensitivity resolution non-destructive examination of magnetic parameters
Abstract
An induction sensor (1) with a local resolution in the microstructure range and a Hall probe (14) record the Barkhausen noise curve to be stored in an intermediate memory (40) at every location moved by a positioning device (22) at a distance controlled by a control circuit over the surface of a test unit (30). By allocating the corresponding parameters to the measuring locations to the characteristic parameters of the Barkhausen noise curve filtered by a discriminator (41), the natural voltage and structural condition of the test unit surface is displayed in an output device (45) at a resolution in the microstructure range
Inventor(s)
Altpeter, I.
Theiner, W.
Gessner, M.
Link to:
Espacenet
Patent Number
1992-4235387
Publication Date
1998
Language
German
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
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