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Title

Vorrichtung zur Inspektion von Testobjekten

Other Title
Test object inspection device e.g. for quality control of integrated circuits and circuit boards - uses X-ray tube and detector displaced in x-y plane for scanning surface of examined object..
Abstract
The inspection device uses an X-ray tube (1) and a cooperating detector (2), each having a narrow field of view relative to the horizontal extent of the examined object (3) and displaced relative to the latter in an x-y plane. The object may be held in a holder during examination via an X-ray tube providing a focal fleck with a diameter above 10 microns and a CCD detector, which is coupled t an evaluation device with a microprocessor. USE - For inspection of circuit board without damage to solder connections.
Patent Number
1997-19715502
Publication Date
2004
Language
German
Fraunhofer-Institut für Integrierte Schaltungen IIS  
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