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  4. Verfahren zur spektralen Analyse einer eine Flackerfrequenz aufweisenden technischen Flamme durch optische Emissions- oder Absorptionsspektroskopie und Anordnung zur Durchführung des Verfahrens
 
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Patent
Title

Verfahren zur spektralen Analyse einer eine Flackerfrequenz aufweisenden technischen Flamme durch optische Emissions- oder Absorptionsspektroskopie und Anordnung zur Durchführung des Verfahrens

Other Title
Process for the spectral analysis of industrial flames by optical emission measurement and arrangement therefor
Abstract
The invention relates to a process for the spectral analysis of flames by measurement of the optical emissions, in which the relatively narrowband emitted radiation of a flame and/or its exhaust gases and the comparable broadband proportions of a background or interference radiation existing concurrently are separated by means of an optical narrowband filter and the radiation penetrating through the filter is detected. The invention proves that a rapid, reliable and highly sensitive spectral emission analysis is possible so that, for example, low pollution concentrations can also be detected and optimum operating conditions can be adjusted. The invention achieves this by detecting the emission of at least two gas components of the same flame simultaneously and independently of each other by receiving the radiation penetrating through a first narrowband filter tuned to a first gas component by means of a first detector and by receiving the radiation filtering through a second narrowband filter tuned to a second gas component by a second detector and forming a second detector output signal, and by ... correlation of the temporal functions of the detector output signals due to the identical flickering frequency of the flame imposed on the gas components during the later detector output signal processing for suppressing ...
Inventor(s)
Tacke, M.
Wolf, H.
Link to:
Espacenet
Patent Number
1992-4231777
Publication Date
1997
Language
German
Fraunhofer-Institut für Physikalische Messtechnik IPM  
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