Verfahren und Schaltungsanordnung zur Pruefung der Funktion einer Schalteinrichtung

The invention relates to a process and a circuit arrangement for the testing of the function of a switching device. According to the invention, a solenoid controllable for test purposes is allocated to a magnetic field sensor and a magnetic field acting on the sensor can be compensated by the said solenoid. In the initially present magnetic field operating the switching device, a resetting of the switching device to the state corresponding to the absence of a magnetic field at the sensor is caused by exciting the solenoid.