Title

12th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2005. Proceedings

Title Supplement

27 June to 1 July 2005, Singapore

Person Involved

Corporate Author

Institute of Electrical and Electronics Engineers -IEEE-, Singapore Section, Reliability CPMT EDS Chapter

IEEE Electron Devices Society

Publisher

Publishing Place

Piscataway, NJ

Publication Date

2005

ISBN

0-7803-9301-5

Conference