Title

Testing, reliability, and application of micro- and nano-material systems II

Title Supplement

15 - 17 March 2004, San Diego, California, USA

Person Involved

Corporate Author

Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.

Publisher

Publishing Place

Bellingham, WA

Publication Date

2004

Series

Proceedings of SPIE; 5392

ISBN

0-8194-5309-9

Conference