Title

Interferometry XVI: Techniques and Analysis

Title Supplement
12.-16.8.2012, San Diego, CA, USA
Person Involved
Corporate Author
Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.
Publisher
Publishing Place
Bellingham, WA
Publication Date
2012
Series
Proceedings of SPIE; 8493
ISBN
978-0-8194-9210-4
Conference