Title

Twenty Seventh Annual IEEE Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2011. Proceedings

Title Supplement

San Jose, CA, USA, March 20-24, 2011

Corporate Author

IEEE Components, Packaging, and Manufacturing Technology Society

National Institute of Standards and Technology -NIST-

Publisher

Publishing Place

Piscataway, NJ

Publication Date

2011

ISBN

978-1-61284-740-5

978-1-61284-734-4

978-1-61284-735-1

Conference