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  4. Testing: Academic and Industrial Conference - Practice and Research Techniques, TAIC PART 2009
 
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Title

Testing: Academic and Industrial Conference - Practice and Research Techniques, TAIC PART 2009

Title Supplement
September 4-6, 2009, Windsor
Corporate Author
Institute of Electrical and Electronics Engineers -IEEE-
Publisher
IEEE  
Publishing Place
New York, NY
Publication Date
2009
ISBN
978-0-7695-3820-4
Conference
Testing - Academic and Industrial Conference - Practice and Research Techniques (TAIC PART) 2009  
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