Title

IEEE/ACM International Conference on Automation of Software Test, AST 2025. Proceedings

Title Supplement
Ottawa, Ontario, Canada, 28-29 April 2025
Corporate Author
Institute of Electrical and Electronics Engineers -IEEE-  
Publisher
Publication Date
2025
ISBN
979-8-3315-0180-8
979-8-3315-0179-2
DOI
Conference
Acronym
AST
Language
English