Title

39th International Symposium for Testing and Failure Analysis 2013. Conference Proceedings

Title Supplement

November 3 - 7, 2013, San Jose, California

Corporate Author

Electronic Device Failure Analysis Society -EDFAS-, Materials Park/Ohio

Publisher

Publishing Place

Materials Park, Ohio

Publication Date

2013

ISBN

1-62708-022-8

978-1-62708-022-4

Conference