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  4. 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007. Proceedings
 
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Title

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007. Proceedings

Title Supplement
26 - 28 Sept. 2007, Rome, Italy
Person Involved
Corporate Author
IEEE Computer Society, Technical Committee on Fault Tolerant Computing
Publisher
IEEE Computer Society Press  
Publishing Place
Los Alamitos, Calif.
Publication Date
2007
ISBN
0-7695-2885-6
Conference
International Symposium on Defect and Fault-Tolerance in VLSI Systems 2007  
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