Title

IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023. Proceedings

Title Supplement
October 25-27, 2023, Milano, Italy
Corporate Author
Politecnico di Milano  
Institute of Electrical and Electronics Engineers -IEEE-  
Publisher
Publication Date
2023
ISBN
979-8-3503-0081-9
979-8-3503-0080-2
979-8-3503-0079-6
DOI
Conference
Acronym
MetroXRAINE
Language
English