Title

IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016

Title Supplement

October 29, 2016-November 6, 2016, Strasbourg

Corporate Author

Institute of Electrical and Electronics Engineers -IEEE-

Publisher

Publishing Place

Piscataway, NJ

Publication Date

2016

ISBN

978-1-5090-1642-6

978-1-5090-1643-3

Conference

Acronym

NSS

MIC

RTSD