Title

IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2025. Proceedings

Title Supplement
October 22-24, 2025, Ancona, Italy
Corporate Author
Institute of Electrical and Electronics Engineers -IEEE-  
Publisher
Publication Date
2025
ISBN
979-8-3315-0280-5
979-8-3315-0279-9
DOI
Conference
Acronym
MetroXRAINE
Language
English