Title

Testing, reliability, and application of micro- and nano-material systems III

Title Supplement
Proceedings of the Third Conference on Testing, Reliability, and Application of Micro- and Nano-Material Systems; 8 - 10 March 2005, San Diego, California, USA
Person Involved
Corporate Author
Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.
Publisher
Publishing Place
Bellingham, WA
Publication Date
2005
Series
Proceedings of SPIE; 5766
ISBN
0-8194-5747-7
Conference