Title

10th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2003. Proceedings

Title Supplement

7 to 11 July 2003, Singapore

Person Involved

Corporate Author

Institute of Electrical and Electronics Engineers -IEEE-

Institute of Electrical and Electronics Engineers -IEEE-, Singapore Section, Reliability CPMT EDS Chapter

IEEE Electron Devices Society

Publisher

Publishing Place

Piscataway, NJ

Publication Date

2003

ISBN

0-7803-7722-2

Conference