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Fundamental analysis of embroidered contacts for electronics in textiles

 
: Linz, Torsten; Simon, E.; Walter, H.

:
Fulltext urn:nbn:de:0011-n-1745712 (531 KByte PDF)
MD5 Fingerprint: bbff5f308dabc9c4e54b65ad2eeaada3
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Created on: 19.12.2013


Institute of Electrical and Electronics Engineers -IEEE-; VDE/VDI-Gesellschaft Mikroelektronik, Mikro- und Feinwerktechnik -GMM-:
3rd Electronics System Integration Technology Conference, ESTC 2010. Proceedings. Vol.2 : Berlin, Germany, 13 - 16 September 2010
New York, NY: IEEE, 2010
ISBN: 978-1-4244-8553-6
ISBN: 978-1-4244-8554-3
pp.688-692
Electronics System Integration Technology Conference (ESTC) <3, 2010, Berlin>
English
Conference Paper, Electronic Publication
Fraunhofer IZM ()

Abstract
Integration of electronics into textiles has been a growing topic in recent years. However, a reliable contact between conductive textile structures and electronics modules is still an insufficiently solved problem. One approach is to embroider the conductive textile right to the electronics. This research describes the constitution of the electrical contact and explains resistance changes during temperature variation. This is done by studying the thermo-mechanical and electrical behavior of the conductive yarn. Experiments are conducted with actual embroidered contacts. The interpretation of results has been confirmed by a simplified contact model. A theory describing the contact mechanism in embroidered contacts has been developed.

: http://publica.fraunhofer.de/documents/N-174571.html