Burmer, C.C.BurmerHopsch, F.F.HopschVermeiren, W.W.Vermeiren2022-03-112022-03-112010https://publica.fraunhofer.de/handle/publica/369955In this paper, we describe a fault localization strategy for scan designs based on Time Resolved Photon Emission (TRE) and analog simulation. After characterizing the defect's electrical footprint using TRE, analog fault simulation is applied. A user - friendly software package with an easy to use interface to scan diagnosis, layout tool and simulator was created.en621conference paper