Krebs, C.C.KrebsSchneider, S.S.SchneiderHommes, A.A.HommesNüßler, D.D.Nüßler2022-03-102022-03-102008https://publica.fraunhofer.de/handle/publica/360636The characterization of materials in the millimeter wave frequency range offer many new applications for quality control and security applications. This paper shows results for different applications with a real aperture scanning system in the frequency range between 75 GHz - 325 GHz in amplitude and phase.en621conference paper