Schöneberg, UweUweSchönebergHosticka, Bedrich J.Bedrich J.HostickaMaclay, Gordon J.Gordon J.MaclayZimmer, GünterGünterZimmer2022-03-082022-03-081990https://publica.fraunhofer.de/handle/publica/302422The measuring accuracy and the signal-to-fault voltage ratio of a circuit configuration and a process for measuring a variable that influences the capacitance curve as a factor of voltage of a capacitive element is improved by calculating the variable from the area below the capacitince curve as a factor of voltage.de608621patent1989-3915563