Birkmann, B.B.BirkmannWeingärtner, R.R.WeingärtnerWellmann, P.P.WellmannWiedemann, B.B.WiedemannMüller, G.G.Müller2022-03-032022-03-032002https://publica.fraunhofer.de/handle/publica/20287210.1016/S0022-0248(01)01935-2en670620530548Analysis of silicon incorporation into VGF-grown GaAsjournal article