Danz, NorbertNorbertDanzFlämmich, MichaelMichaelFlämmichMichaelis, DirkDirkMichaelisSchmidt, TobiasTobiasSchmidtBrütting, WolfgangWolfgangBrütting2022-03-122022-03-122012https://publica.fraunhofer.de/handle/publica/376962en620Accessing OLED emitter properties by radiation pattern analysisconference paper