Perdochová, A.A.PerdochováMelov, V.G.V.G.MelovBesse, I.I.BesseDubecky, F.F.DubeckyNecas, V.V.NecasHaupt, L.L.Haupt2022-03-102022-03-102005https://publica.fraunhofer.de/handle/publica/350012en620Active area of GaAs pad detector tested by X-ray beamconference paper