Fried, M.M.FriedPetrik, P.P.PetrikHorvath, Z.E.Z.E.HorvathLohner, T.T.LohnerSchmidt, C.C.SchmidtSchneider, C.C.SchneiderRyssel, H.H.Ryssel2022-03-102022-03-102006https://publica.fraunhofer.de/handle/publica/35283210.1016/j.apsusc.2006.06.009en670620530669Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin filmsconference paper