Irmer, G.G.IrmerMonecke, J.J.MoneckeVerma, P.P.VermaGoerigk, G.G.GoerigkHerms, M.M.Herms2022-03-032022-03-032000https://publica.fraunhofer.de/handle/publica/19826810.1063/1.1305462en620658670530Size analysis of nanocrystals in semiconductor doped glasses with anomalous small-angle X-ray and raman scatteringjournal article