Hillmann, S.S.HillmannHeuer, H.H.HeuerBaron, H.-U.H.-U.BaronBamberg, J.J.BambergYashan, A.A.YashanMeyendorf, N.N.Meyendorf2022-03-112022-03-112009https://publica.fraunhofer.de/handle/publica/36252510.1063/1.31141132-s2.0-65349128761en620530Near-surface residual stress-profiling with high frequency Eddy current conductivity measurementconference paper