Krebs, C.C.KrebsWarok, P.P.WarokHeinen, S.S.HeinenBrauns, R.R.BraunsHommes, A.A.HommesKose, S.S.KoseTeichrib, W.W.TeichribGütgemann, S.S.GütgemannNüßler, D.D.Nüßler2022-03-112022-03-112011https://publica.fraunhofer.de/handle/publica/37437810.1109/irmmw-THz.2011.6105003The following paper describes the development of an autonomous and compact millimeter wave scanning measurement system (SAMMI - Stand Alone Millimeter wave Imager) which works in the W-Band (CW@78GHz). SAMMI® was developed to demonstrate the high potential and usability of the millimeter wave region for material classification[1].en621conference paper