Wunderle, B.B.WunderleDermitzaki, E.E.DermitzakiKeller, J.J.KellerVogel, D.D.VogelMichel, B.B.Michel2022-03-102022-03-102004https://publica.fraunhofer.de/handle/publica/34694810.1109/NANO.2004.1392291With the development of micro- and nanotechnological products such as sensors, MEMS and NEMS and their broad application new reliability issues will arise. The authors present a combined experimental and simulative approach targeted on unsolved questions of size effects within newly developed nanomaterials and highly integrated systems. The experimental approach is based on in-situ SPM scans of the analyzed object carried out at different thermomechanical load states. With the application of digital image correlation techniques displacement fields with nanometer accuracy are derived. A simulative approaches is performed by homogenization which is the modeling of a representative volume of bulk material taking into account spatial distribution of filler particles. The results of the homogenization are input data for standard finite element codes.ennano deformation analysis621conference paper