Zimmermann, H.H.ZimmermannKeller, R.C.R.C.KellerMeisen, P.P.MeisenSeelmann Eggebert, M.M.Seelmann Eggebert2022-03-032022-03-031997https://publica.fraunhofer.de/handle/publica/19041910.1016/S0039-6028(96)01519-1The formation and the growth of Sn films on CdTe(111) have been studied by hemispherically recorded ARXPS. The XPD patterns show that these films consist of alpha-Sn. XPD and ARXPS depth profile analysis reveal the presence of an intermixing zone at the interface which establishes during the initial stages of film formation.enAlpha-SnARXPSCdTecontactKontaktXPD621667541journal article