Characterization of hard disk substrates (NiP/Al, glass) using XPS

Ochs, D.D.OchsDieckhoff, S.S.DieckhoffCord, B.B.Cord2022-03-032022-03-032000https://publica.fraunhofer.de/handle/publica/19661210.1002/1096-9918(200008)30:1<12::AID-SIA770>3.0.CO;2-Ben620660671543Characterization of hard disk substrates (NiP/Al, glass) using XPSjournal article