Laskin, GennadiiGennadiiLaskinSeyler, TobiasTobiasSeylerFratz, MarkusMarkusFratzBertz, AlexanderAlexanderBertzCarl, DanielDanielCarl2023-11-092023-11-092023https://publica.fraunhofer.de/handle/publica/456665We present a novel method to extend the unambiguous height measurement range in multi-wavelength holography using matching with a CAD model. For test measurements the range was increased from 20 µm to 100 mm with the automatic determination of object surfaces.enMultiwavelength digital holographyHeight measurementExtended Unambiguous Measurement Range in Multi-Wavelength Digital Holography Using Virtual CAD Rendered Height Mapsconference paper