A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layers

Murakami, M.M.MurakamiRommel, M.M.RommelYanev, V.V.YanevErlbacher, T.T.ErlbacherBauer, A.J.A.J.BauerFrey, L.L.Frey2022-03-042022-03-042011https://publica.fraunhofer.de/handle/publica/22553010.1063/1.3631088enIV characteristicsalpha-Vcurrent conduction mechanisms670620530A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layersjournal article