Sklarczyk, C.C.Sklarczyk2022-03-032022-03-031998https://publica.fraunhofer.de/handle/publica/193689By processing the reflected and transmitted components of radiated microwaves, coatings on a range of substrates can be characterised. The method is specially well-suited to on-line process control. In addition to yielding coating thickness data, information on, for example, dielectric properties can also be obtained of a more general characterisation of the coatings is possible. In addition to a straightforward description of coating thickness measurement, an example is quoted for zirconia coatings on steel for which coating thickness varations are demonstrateddecoating thicknessmicrowaveMikrowelleMikrowellenverfahrennondestructive testingSchichtzerstörungsfreie Prüfung620658670671journal article