Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples. Numerical investigation

Under CopyrightSimon, Flaviu-BogdanFlaviu-BogdanSimon2022-03-1423.10.20182018https://publica.fraunhofer.de/handle/publica/40188110.24406/publica-fhg-401881en670620530Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples. Numerical investigationposter