Under CopyrightRuckdäschel, SimoneSimoneRuckdäschelWegener, JoachimJoachimWegener2022-03-133.8.20182018https://publica.fraunhofer.de/handle/publica/40103710.24406/publica-fhg-401037en621Expanding the information depth of impedance based assays by using piezoelectric growth substratesconference paper