Trost, MarcusMarcusTrostHerffurth, TobiasTobiasHerffurthSchröder, SvenSvenSchröderDuparré, AngelaAngelaDuparréTünnermann, AndreasAndreasTünnermann2022-03-042022-03-042014https://publica.fraunhofer.de/handle/publica/23552810.1364/AO.53.00A1972-s2.0-84942366711Scattering from multilayer coatings depends on the roughness of each interface as well as their cross-correlation properties. By depositing thin film coatings under oblique incidence, the cross-correlation properties can be specifically adapted and consequently also the scattering characteristics. This will be illustrated for Mo/Si multilayers, for which a scattering reduction of more than 30% can be achieved. The characterization techniques used comprise of cross-sectional transmission electron microscopy, atomic force microscopy, and angle-resolved light scattering measurements at a wavelength of 13.5 nm.en535journal article