CC BY 4.0Piechaczek, Denis SzymonDenis SzymonPiechaczekSchrey, OlafOlafSchreyLigges, ManuelManuelLiggesHosticka, Bedrich J.Bedrich J.HostickaKokozinski, RainerRainerKokozinski2023-08-152023-08-152022-10-04https://doi.org/10.24406/publica-470https://publica.fraunhofer.de/handle/publica/428457https://doi.org/10.24406/publica-47010.3390/s2219752010.24406/publica-4702-s2.0-85139917124This paper presents an investigation of the responsivity of a time-delay integration (TDI) charge-coupled device that employs anti-blooming clocking and uses a varying number of TDI stages. The influence of charge blooming caused by unused TDI stages in a TDI deployed selection scheme is shown experimentally, and an anti-blooming clocking mechanism is analyzed. The impact of blooming on sensor characteristics, such as the responsivity, the conversion gain, and the signal-to-noise ratio, is investigated. A comparison of the measurements with and without this anti-blooming clocking mechanism is presented and discussed in detail.encharge-coupled deviceresponsivityphoton transfer curveconversion gainsignal-to-noise ratiobloomingtime delay integrationjournal article