Heinz, FriedemannFriedemannHeinzOezkent, MaximilianMaximilianOezkentRittmann, ClaraClaraRittmannSchindler, FlorianFlorianSchindlerSchubert, MartinMartinSchubertKwapil, WolframWolframKwapilGlunz, StefanStefanGlunz2023-10-192023-10-192022Note-ID: 00009222https://publica.fraunhofer.de/handle/publica/451934enMicroscopic Charge Carrier Lifetime Mapping for Silicon Material Analysispresentation