Novell test concept for experimental lifetime prediction of miniaturized lead-free solder contacts

Röllig, M.M.RölligDudek, R.R.DudekWiese, S.S.WieseWunderle, B.B.WunderleWolter, K.-J.K.-J.WolterMichel, B.B.Michel2022-03-102022-03-102005https://publica.fraunhofer.de/handle/publica/35034610.1109/ESIME.2005.1502779en621Novell test concept for experimental lifetime prediction of miniaturized lead-free solder contactsconference paper