High-speed photographic study of wave propagation and impact damage in fused silica and aion using the edge-on impact (EOI) method

Straßburger, E.E.StraßburgerPatel, P.P.PatelCauley, J.W.J.W.CauleyTempleton, D.W.D.W.Templeton2022-03-102022-03-102005https://publica.fraunhofer.de/handle/publica/348046en620High-speed photographic study of wave propagation and impact damage in fused silica and aion using the edge-on impact (EOI) methodconference paper