Thin layers and multilayers of porous silicon X-ray diffraction investigation

Buttard, D.D.ButtardBellet, D.D.BelletDolino, G.G.DolinoBaumbach, T.T.Baumbach2022-03-032022-03-031998https://publica.fraunhofer.de/handle/publica/19379510.1063/1.367438en620658670530Thin layers and multilayers of porous silicon X-ray diffraction investigationjournal article