Gogotsi, Y.G.Y.G.GogotsiDomnich, V.V.DomnichDub, S.N.S.N.DubKailer, A.A.KailerNickel, K.G.K.G.Nickel2022-03-032022-03-032000https://publica.fraunhofer.de/handle/publica/19793010.1557/JMR.2000.0124en531620Cyclic nanoindentation and Raman microspectroscopy study of phase transformations in semiconductorsjournal article